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Xiaoming Wang
at Beijing Univ of Technology
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Publications (1)
Proceedings Article | 5 December 2005 Paper
The reliability of tunnel junction regenerated light emitting diodes
Xiaoming Wang, Weiling Guo, Yongtao Tian, Xia Guo, Guo Gao, Guangdi Shen
Proceedings Volume 6020, 60201X (2005) https://doi.org/10.1117/12.635049
KEYWORDS: Light emitting diodes, Reliability, Aluminium gallium indium phosphide, Electrons, Failure analysis, Quantum efficiency, Resistance, Optoelectronics, Mathematics, Mathematical modeling
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