Yoshiharu Terui
at Tokyo Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 April 2005 Paper
Proceedings Volume 5724, (2005) https://doi.org/10.1117/12.590116
KEYWORDS: Polarization, Silicon, Thermal optics, Refractive index, Birefringence, Waveguides, Polymers, Temperature metrology, Polymethylmethacrylate, Polymer thin films

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