Mr. Chang Kyu Park Profile

Chang Kyu Park

at SAMSUNG Electronics Co Ltd

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Publications (1)

Proceedings Article | 24 April 2020 Presentation

A study of failure criteria for a crack in multilayer ceramic capacitors by ball drop test (Conference Presentation)

Soo-Hyun Eom, Jung-Ryul Lee, Dae Sung Son, Chun Myung Park, Jae Hoon Lim, Seong Jin Kim, Chang Kyu Park

Proceedings Volume 11376, 113760W (2020) https://doi.org/10.1117/12.2558351

KEYWORDS: Ceramics, Capacitors, Velocity measurements, Failure analysis, Laser Doppler velocimetry, Sensors, Electronic components, Ferroelectric materials, Dielectrics, Electrical breakdown

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