Prof. Qian Chen
at Nanjing Univ of Science and Technology
SPIE Involvement:
Author | Editor
Publications (262)

SPIE Journal Paper | 17 December 2024
Hu Jin, Kan Ren, Qian Chen
JARS, Vol. 19, Issue 01, 014503, (December 2024) https://doi.org/10.1117/12.10.1117/1.JRS.19.014503
KEYWORDS: Unmanned aerial vehicles, Image segmentation, Semantics, Remote sensing, Roads, Satellites, Education and training, Sensors, Feature extraction, Buildings

Proceedings Article | 27 November 2023 Paper
Proceedings Volume 12768, 127680X (2023) https://doi.org/10.1117/12.2688338
KEYWORDS: Digital holography, Holograms, Holography, Phase reconstruction, Demodulation, Deep learning, Education and training, Fourier transforms, Data modeling, Phase recovery

Proceedings Article | 20 September 2023 Paper
Proceedings Volume 12608, 126081M (2023) https://doi.org/10.1117/12.3008164
KEYWORDS: Light sources and illumination, Diffraction, 3D metrology, Optical tomography, Tomography, Phase transfer function, Phase shift keying, Imaging systems, Tunable filters, Synthetic aperture microscopy

Proceedings Article | 14 June 2023 Poster + Paper
Haitao Guan, Yan Hu, Jiaxue Zeng, Chao Zuo, Qian Chen
Proceedings Volume 12523, 125230H (2023) https://doi.org/10.1117/12.2665635
KEYWORDS: Wavefronts, Super resolution, Resolution enhancement technologies, Imaging systems, Synthetic apertures

SPIE Journal Paper | 17 May 2023 Open Access
APN, Vol. 2, Issue 03, 036010, (May 2023) https://doi.org/10.1117/12.10.1117/1.APN.2.3.036010
KEYWORDS: Education and training, Data modeling, Deep learning, Optical metrology, Fringe analysis, Visual process modeling, Feature extraction, Photonics, Performance modeling, Error analysis

Showing 5 of 262 publications
Proceedings Volume Editor (3)

Conference Committee Involvement (3)
Ninth Symposium on Novel Photoelectronic Detection Technology and Applications (NDTA2022)
2 November 2022 | Hefei, China
Sixth Symposium on Novel Photoelectronic Detection Technology and Application
3 December 2019 | Beijing, China
ISPDI 2013: Infrared Imaging and Applications
25 June 2013 | Beijing, China
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